Company Filing History:
3 out of 5 
1 out of 1 Years Active: 2014-2022
Title: Innovations of Jianhua Qi
Introduction
Jianhua Qi is a notable inventor based in Shanghai, China. He has made significant contributions to the field of semiconductor technology, holding a total of four patents. His work focuses on improving testing methods and systems for integrated circuits (ICs), which are crucial for the advancement of electronic devices.
Latest Patents
One of Jianhua Qi's latest patents is a "Universal semiconductor-based automatic high-speed serial signal testing method." This invention relates to a method that allows for the direct testing of high-speed serial interface signals using universal automatic testing equipment (ATE) during mass production. It enhances testing convenience and efficiency by enabling a chip to send high-speed serial signals through an impedance matching unit, followed by a phase shift unit, and ultimately to an acquisition unit for data processing.
Another significant patent is the "IC test information management system based on industrial internet." This invention provides a method and system for managing IC test data and resource data. It analyzes the test data generated by an IC test platform, which consists of multiple stages and various test devices. This system aims to utilize the value of test data generated during IC tests, offering technical support for improved testing processes.
Career Highlights
Jianhua Qi has worked with several companies, including Sino IC Technology Co., Ltd. and Shanghai Haifeng Electrical Lighting Co., Ltd. His experience in these organizations has contributed to his expertise in semiconductor technology and testing methodologies.
Collaborations
Some of Jianhua Qi's notable coworkers include Zhiyong Zhang and Bin Luo. Their collaboration has likely fostered innovation and development in their respective fields.
Conclusion
Jianhua Qi's contributions to semiconductor technology through his patents and career experiences highlight his role as an influential inventor. His work continues to impact the efficiency and effectiveness of IC testing methods in the industry.