The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
May. 17, 2011
Jie Zhang, Shanghai, CN;
Zhiyong Zhang, Shanghai, CN;
Shouyin YE, Shanghai, CN;
Jianhua Qi, Shanghai, CN;
Jie Zhang, Shanghai, CN;
Zhiyong Zhang, Shanghai, CN;
Shouyin Ye, Shanghai, CN;
Jianhua Qi, Shanghai, CN;
Sino IC Technology Co., Ltd., Shanghai, CN;
Abstract
A test apparatus with physical separation feature is disclosed. The test apparatus includes probes (), a peripheral circuit (), a circuit of special function (), wherein the peripheral circuit and the circuit of special function are separately arranged on different circuit boards (). The peripheral circuit and the circuit of special function are both electrically connected to the probes. In the test apparatus with physical separation feature, the peripheral circuit and the circuit of special function are separated in physical spaces, so that interference between the components is prevented and the testing cost is reduced.