This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Other. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: Jianhua Deng: Innovator in Reliability Assessment for Protection Systems
Introduction
Jianhua Deng is a notable inventor based in Guangzhou, China. He has made significant contributions to the field of reliability assessment, particularly in wide area protection systems. His innovative approach addresses critical technical challenges in ensuring the reliability of these systems.
Latest Patents
Jianhua Deng holds a patent for a "Method and device for reliability assessment of wide area protection system." This patent provides a solution to the limitation of existing reliability research, which primarily focuses on communication networks without a comprehensive reliability analysis model for the overall system. The method involves acquiring an information acceptance rate of a wide area monitoring center, obtaining various accuracy metrics related to protection initiation, fault area positioning, and fault element recognition, and ultimately calculating the decision accuracy of the wide area protection system.
Career Highlights
Throughout his career, Jianhua Deng has worked with various organizations, including China Tiesiju Civil Engineering Group Co., Ltd. His expertise in reliability assessment has positioned him as a key figure in the development of advanced protection systems.
Collaborations
Jianhua has collaborated with notable professionals in his field, including Ruiwen He and Hao Peng. Their collective efforts have contributed to advancements in reliability assessment methodologies.
Conclusion
Jianhua Deng's innovative work in reliability assessment for wide area protection systems showcases his commitment to enhancing the safety and efficiency of these critical infrastructures. His contributions are invaluable to the field and continue to influence future developments.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile