Lemont, IL, United States of America

Jiangwei Wen

This inventor holds 1 USPTO granted patent. Top assignee: Uchicago Argonne, LLC. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jiangwei Wen. Retrieved from https://idiyas.com/inventor/jiangwei-wen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Jiangwei Wen and Nanowire Membrane Innovation

Introduction

Jiangwei Wen is an inventor associated with Lemont, Illinois, and Uchicago Argonne, LLC. His patent work includes a nanowire membrane designed to support catalytic reactions under low-pressure conditions.

Latest Patents

Wen is named on one patent: “Low Pressure Nanowire Membrane for Catalytic Reactions and Methods of Making and Using the Same.” The invention describes assembling metal or metal-alloy nanowires into a nanoporous membrane. The membrane can be used to catalyze reactions at low pressures while supporting high flow rates. In particular, embodiments can catalyze copper-catalyzed azide–alkyne cycloaddition (CuAAC) reactions with high efficiency and minimal leaching of active copper species.

Career Highlights

Wen’s listed patent count is 1 patent. His work reflects an application of nanomaterials to catalytic processes, with an emphasis on membrane design, reaction efficiency, and limiting the loss of active catalytic material.

Collaborations

Wen’s listed coworkers include Xiao-Min Lin and Kun Wu. Their names are associated with the collaborative research context surrounding the nanowire membrane invention.

Conclusion

Jiangwei Wen’s patent presents a nanoporous nanowire membrane approach for efficient, high-flow catalytic reactions under low pressure, including CuAAC reactions with minimal copper leaching.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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