This inventor holds 2 USPTO granted patents. Top assignee: US Government as Represented by the Secretary of the Army. Active years: 2011-2012.
Company Filing History:
Years Active: 2011-2012
Title: Innovations of Jianguo Wen in Microscopic Sample Observation
Introduction
Jianguo Wen is a notable inventor based in Champaign, IL (US). He has made significant contributions to the field of microscopic observation through his innovative patents. With a total of 2 patents, his work focuses on enhancing the methods used for observing very small wet samples.
Latest Patents
Jianguo Wen's latest patents include a "Method of use of reusable sample holding device permitting ready loading of very small wet samples." This method allows for the efficient loading of small wet samples for observation using various microscopic equipment, particularly in vacuum environments. The invention features a thin-membrane window etched in the center of two silicon wafers, which contain the sample in a small uniform gap. This gap can be adjusted using spacers or determined by the thickness of the fluid film containing the sample. To optimize resolution, each window is designed to have a thickness of approximately 50 nm, with the gap also around 50 nm. Another patent is the "Reusable sample holding device permitting ready loading of very small wet samples," which shares similar functionalities and applications.
Career Highlights
Jianguo Wen is currently associated with the US Government as represented by the Secretary of the Army. His work has been instrumental in advancing the techniques used in microscopic analysis, particularly for small samples that require precise observation.
Collaborations
Some of his notable coworkers include Charles P Marsh and Eric Olson. Their collaborative efforts contribute to the innovative research and development in the field of microscopy.
Conclusion
Jianguo Wen's contributions to the field of microscopic observation through his patents demonstrate his commitment to innovation and advancement in scientific research. His work continues to influence the methodologies used in various microscopic applications.