Shanghai, China

Jiang-Ling Li

This inventor holds 1 USPTO granted patent. Top assignee: Tongji University. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jiang-Ling Li. Retrieved from https://idiyas.com/inventor/jiang-ling-li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Jiang-Ling Li: Innovator in Polyanthrylene Materials

Introduction

Jiang-Ling Li is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of materials science, particularly through his innovative work on polyanthrylene materials. His research focuses on the preparation and application of these materials, which have practical uses in various industries.

Latest Patents

Jiang-Ling Li holds a patent for "Polyanthrylene materials and methods for their preparation and use." This patent discloses compositions containing polyanthrylene and methods for making these compositions. Notably, the polyanthrylene composition can be utilized for the detection of iron in a sample, showcasing its potential applications in analytical chemistry.

Career Highlights

Li is affiliated with Tongji University, where he continues to advance his research in materials science. His work has garnered attention for its innovative approach and practical applications, contributing to the academic community and industry alike.

Collaborations

Some of his notable coworkers include Mei-rong Huang and Shao-jun Huang. Their collaborative efforts have further enhanced the research output and innovation in their field.

Conclusion

Jiang-Ling Li's contributions to polyanthrylene materials exemplify the intersection of innovation and practical application in science. His work not only advances academic knowledge but also has the potential to impact various industries positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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