San Jose, CA, United States of America

Jian Wang

This inventor holds 1 USPTO granted patent and 6 published patent applications. Top assignee: Simplex Solutions, Inc.. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jian Wang. Retrieved from https://idiyas.com/inventor/jian-wang-ftclakg1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Jian Wang

Introduction

Jian Wang is a notable inventor based in San Jose, California. He has made significant contributions to the field of integrated circuit technology. His work focuses on improving the measurement techniques used in electronic components.

Latest Patents

Wang holds a patent for a method of measuring interconnect coupling capacitance in an integrated circuit chip. This innovative method involves several steps, including shorting interconnect lines and measuring capacitance values to determine the coupling capacitance between them. The formula used in this process is Cc=(C1+C2-Ct)/2, which provides a reliable means of assessing interconnect performance.

Career Highlights

Jian Wang is currently employed at Simplex Solutions, Inc., where he continues to develop and refine technologies related to integrated circuits. His expertise in capacitance measurement has positioned him as a valuable asset in the field of electronics.

Collaborations

Wang collaborates with Narain D Arora, enhancing the innovative capabilities of their team. Their combined efforts contribute to advancements in integrated circuit technology.

Conclusion

Jian Wang's contributions to the field of integrated circuits through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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