Changzhou, China

Jian Pan

This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Ohaus Instruments (Shanghai) Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jian Pan. Retrieved from https://idiyas.com/inventor/jian-pan-oly4l3o2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2017

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2 patents (USPTO):Explore Patents

Title: Jian Pan: Innovator in Weight Measurement Technology

Introduction

Jian Pan is a notable inventor based in Changzhou, China. He has made significant contributions to the field of weight measurement technology. With a total of 2 patents to his name, Jian Pan continues to push the boundaries of innovation in his industry.

Latest Patents

Among his latest inventions are the "Weight Measuring Instrument" and the "Weight Measuring Instrument with Cover." These patents reflect his commitment to enhancing the accuracy and usability of weight measurement devices.

Career Highlights

Jian Pan is currently employed at Ohaus Instruments (Shanghai) Co., Ltd. His work at this company has allowed him to develop and refine his innovative ideas, contributing to the advancement of measurement technology.

Collaborations

Throughout his career, Jian has collaborated with talented individuals such as Haisong Zhan and Duochan Hu. These partnerships have fostered a creative environment that encourages the exchange of ideas and expertise.

Conclusion

Jian Pan's contributions to weight measurement technology exemplify his dedication to innovation. His patents and collaborations highlight his role as a key figure in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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