Nanjing, China

Jian Luo

This inventor holds 1 USPTO granted patent and 4 published patent applications. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jian Luo. Retrieved from https://idiyas.com/inventor/jian-luo-hhu75r62

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jian Luo: Inventor of a Virtual Machine Management System

Introduction

Jian Luo is an inventor based in Nanjing, China. His patent work includes a system for managing virtual machines through snapshots, with a focus on preserving a user’s virtual application experience when a virtual machine becomes idle.

Latest Patents

The available information lists one patent for Jian Luo: Virtual Machine Managing System Using Snapshot. The invention describes a virtualization platform that detects when a user device disconnects from a virtual machine and uses a machine-learning model to determine whether that machine is idle. The platform can then capture a snapshot and stop hosting the idle virtual machine. If the same user later requests the previously used application from another device, the platform can start a new virtual machine and load the snapshot information into its memory, allowing the user to continue.

Career Highlights

Jian Luo’s listed patent activity comprises 1 patent. The disclosed invention addresses virtual machine resource management while supporting continuity across user devices.

Collaborations

The provided information identifies Shuai Ye and Ke Xu as Jian Luo’s coworkers. Their specific roles in the patent or related work are not stated.

Conclusion

Jian Luo’s listed invention combines machine-learning-based idle-state detection with snapshot restoration to manage virtual machines and help users resume applications across devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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