Company Filing History:
Years Active: 2017
Title: Innovations of Jian Jun Ju in LED Testing Processes
Introduction
Jian Jun Ju is a notable inventor based in Chengdu, China. He has made significant contributions to the field of LED technology, particularly in the area of testing processes. His innovative approach has led to the development of a unique method that enhances the accuracy of LED testing.
Latest Patents
Jian Jun Ju holds a patent for an LED testing process and correction methods therefor. This patent outlines a method of generating a correction function for a light-emitting diode (LED) testing process. The process includes detecting light emitted by a reference LED and reflected from inactive LEDs on a panel within a field of view of a detector. It also involves varying the number of inactive LEDs to derive uncorrected values of an optical parameter as a function of the number of inactive LEDs. Additionally, the method detects light emitted by the reference LED or by an active LED with identical optical properties to determine at least one reference value for each optical parameter. Finally, it calculates differences between the uncorrected values and each reference value to generate the correction function, which is based on the number of inactive LEDs arranged within the field of view of the detector during the light detecting step.
Career Highlights
Jian Jun Ju is currently employed at Asm Technology Singapore Pte Ltd, where he continues to innovate in the field of LED technology. His work has been instrumental in advancing testing methodologies that improve the reliability and performance of LED products.
Collaborations
Some of his coworkers include Ka Yee Mak and Sai Kit Wong, who contribute to the collaborative environment that fosters innovation at Asm Technology Singapore Pte Ltd.
Conclusion
Jian Jun Ju's contributions to LED testing processes exemplify the impact of innovative thinking in technology. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving LED testing methodologies.