Province, China

Jian-de Jiang

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Novatek Microelectronics Corp.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jian-de Jiang. Retrieved from https://idiyas.com/inventor/jian-de-jiang-e740fo9v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Biography of Jian-de Jiang

Introduction

Jian-de Jiang is an accomplished inventor based in Shaanxi Province, China. He has made significant contributions to the field of image processing, particularly in the area of 2D to 3D image conversion.

Latest Patents

Jian-de Jiang holds a patent for a "Depth generation method and apparatus using the same." This innovative method is designed for a 2D to 3D image conversion device. The process involves obtaining motion vectors in an image frame through motion estimation, calculating motion differences, and deriving depth-from-motions for each block based on these differences.

Career Highlights

Jian-de Jiang is currently employed at Novatek Microelectronics Corporation, where he continues to develop cutting-edge technologies in image processing. His work has been instrumental in advancing the capabilities of 3D imaging systems.

Collaborations

Throughout his career, Jian-de Jiang has collaborated with notable colleagues, including Guang-Zhi Liu and Chun Wang. These partnerships have fostered innovation and contributed to the success of their projects.

Conclusion

Jian-de Jiang's expertise and innovative spirit have positioned him as a key figure in the field of image processing. His contributions, particularly in depth generation methods, are paving the way for advancements in 3D imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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