Jilin, China

Jia You

This inventor holds 1 USPTO granted patent. Top assignee: Chinese Academy of Sciences. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jia You. Retrieved from https://idiyas.com/inventor/jia-you-q7xmbiov

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovations of Jia You in Linear Encoder Technology

Introduction

Jia You is an accomplished inventor based in Jilin, China. He has made significant contributions to the field of absolute-type linear encoder measurements. His innovative work addresses critical challenges in signal consistency and measurement precision.

Latest Patents

Jia You holds a patent for an "Absolute-type linear encoder absolute signal consistency correction method." This method is designed to solve the issues of narrow linear range for photoelectric responses and large signal dispersion found in existing consistency correction methods. The correction method enhances absolute signal quality and increases system measurement precision, making it a valuable advancement in the field.

Career Highlights

Jia You is affiliated with the Chinese Academy of Sciences, where he continues to push the boundaries of technology and innovation. His work has garnered attention for its practical applications and contributions to the scientific community.

Collaborations

Jia You has collaborated with notable colleagues, including Fan Yang and Qifeng Zeng, who have contributed to his research and development efforts.

Conclusion

Jia You's innovative approach to linear encoder technology exemplifies the importance of addressing technical challenges in measurement systems. His contributions are paving the way for advancements in precision measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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