Plainsboro, NJ, United States of America

Jia Ming Chen

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Sarnoff Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jia Ming Chen. Retrieved from https://idiyas.com/inventor/jia-ming-chen-8jwsbze0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jia Ming Chen

Introduction

Jia Ming Chen is an accomplished inventor based in Plainsboro, NJ (US). He has made significant contributions to the field of electrical sensors, particularly through his innovative patent on solid phase sensors. His work has implications for various applications in measurement technology.

Latest Patents

Jia Ming Chen holds a patent for a solid phase array of electrical sensors. This invention comprises channels and electrical leads that attach to a voltage, current, or resistivity meter for measuring the voltage, current, or resistivity through the pore. The channels are formed from a single substrate, showcasing a novel approach to sensor design. He has 1 patent to his name.

Career Highlights

Jia Ming Chen is currently employed at Sarnoff Corporation, where he continues to develop and refine his innovative ideas. His work at Sarnoff Corporation has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of his notable coworkers include Yongchi Tian and Zilan Shen, who contribute to the collaborative environment that fosters innovation at Sarnoff Corporation.

Conclusion

Jia Ming Chen's contributions to the field of electrical sensors exemplify the spirit of innovation. His patent on solid phase sensors highlights his commitment to advancing technology in measurement applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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