Jia-Mau Jian

Title: Jia-Mau Jian: Innovator in Automatic Virtual Metrology

Introduction

Jia-Mau Jian is a prominent inventor based in Kaohsiung, Taiwan. He has made significant contributions to the field of virtual metrology, particularly through his innovative patent. His work is recognized for its potential to enhance the accuracy and efficiency of metrology processes in various applications.

Latest Patents

Jia-Mau Jian holds a patent titled "System and method for automatic virtual metrology." This patent describes a server, a system, and a method for automatic virtual metrology (AVM). The AVM system comprises a model-creation server and multiple AVM servers. The model-creation server constructs a first set of virtual metrology (VM) models, which include a VM conjecture model, a Reliance Index (RI) model, a Global Similarity Index (GSI) model, a Process Data Quality Index (DQI) model, and a Metrology Data Quality Index (DQI) model. The AVM method allows the model-creation server to distribute these VM models to other AVM servers of the same equipment type, enabling each server to perform automatic model refreshing processes to maintain the accuracy of its VM models.

Career Highlights

Jia-Mau Jian is affiliated with National Cheng-Kung University, where he contributes to research and development in metrology and related fields. His work has garnered attention for its innovative approach to improving measurement accuracy in various industrial applications.

Collaborations

Jia-Mau Jian has collaborated with notable colleagues, including Fan-Tien Cheng and Hsien-Cheng Huang. These collaborations have furthered advancements in the field of virtual metrology and have contributed to the success of his projects.

Conclusion

Jia-Mau Jian is a key figure in the realm of automatic virtual metrology, with a patent that showcases his innovative approach to enhancing measurement processes. His contributions continue to influence the field and pave the way for future advancements.