Company Filing History:
Years Active: 2010
Title: Innovations by Jia-Chi Ho in Probing Device Technology.
Introduction
Jia-Chi Ho is a notable inventor based in Hsinchu Hsiang, Taiwan. He has made significant contributions to the field of probing devices, which are essential in the testing of integrated circuits. His innovative approach has led to the development of a unique probing device that enhances the efficiency and accuracy of electronic component testing.
Latest Patents
Jia-Chi Ho holds 1 patent for his invention of a probing device. This device features a rack that includes an outer support member, which supports a circuit layer, and a center support member that supports a probe assembly. The design allows for effective stress management during testing, as the outer support member bears the touchdown stress when the tester contacts the circuit layer. Additionally, the center support member absorbs the reaction force from the IC wafer when the probes touch down on the electronic components.
Career Highlights
Jia-Chi Ho is currently employed at Mjc Probe Inc., where he continues to innovate in the field of probing technology. His work has been instrumental in advancing the capabilities of testing equipment used in the semiconductor industry. His dedication to research and development has positioned him as a key figure in his field.
Collaborations
Jia-Chi Ho collaborates with talented individuals such as Wei-Cheng Ku and Chih-Hao Ho. Their combined expertise contributes to the ongoing success and innovation at Mjc Probe Inc.
Conclusion
Jia-Chi Ho's contributions to probing device technology exemplify the importance of innovation in the semiconductor industry. His patent and ongoing work continue to influence the efficiency of electronic testing processes.