Taipei, Taiwan

Ji-Yi Yang

This inventor holds 1 USPTO granted patent. Top assignee: Wistron Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ji-Yi Yang. Retrieved from https://idiyas.com/inventor/ji-yi-yang-t5vyd1pz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Ji-Yi Yang and Portable Wound Measurement

Introduction

Ji-Yi Yang is an inventor based in Taipei, Taiwan. His work includes a patent for using a portable electronic device to measure wound dimensions from an image.

Latest Patents

Yang is associated with 1 patent: “Portable Electronic Device and Wound-Size Measuring Method Using the Same.” The invention describes capturing an image with a device camera, applying a convolutional neural network to identify the image region most likely to contain a wound, and estimating the wound’s actual height and width. The calculation uses the device’s reported lens focal length, calibration parameters corresponding to its pitch angle, and the wound image’s pixel-height and pixel-width ratios.

Career Highlights

Yang is associated with Wistron Corporation. His patented method combines image recognition with device and calibration data to estimate wound size using a portable electronic device.

Collaborations

The provided information lists Chi Lun Huang and Zhe-Yu Lin as Yang’s coworkers. It does not specify their roles in the patent or whether they collaborated on the invention.

Conclusion

Ji-Yi Yang’s patent presents a portable, image-based approach to estimating wound dimensions, connecting computer vision with device calibration for practical measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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