Seoul, South Korea

Ji Yeon Ma

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ji Yeon Ma. Retrieved from https://idiyas.com/inventor/ji-yeon-ma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Ji Yeon Ma: Innovator in Electronic Device Technology

Introduction

Ji Yeon Ma is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of electronic devices, particularly through his innovative patent that enhances user interaction with screens.

Latest Patents

Ji Yeon Ma holds a patent for a "Screen control method and electronic device supporting the same." This invention involves an electronic device equipped with a sensor that detects the external environment. The device features a display that presents a first screen containing one or more movable particles. The memory of the device stores instructions that, when executed, enable the processor to gather information about the external environment and adjust the display state of the movable particles accordingly.

Career Highlights

Ji Yeon Ma is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His work focuses on developing advanced electronic devices that improve user experience and interaction.

Collaborations

Some of Ji Yeon Ma's notable coworkers include Dong Hyeon Kim and Jin Ha Lee, who contribute to the innovative projects at Samsung Electronics.

Conclusion

Ji Yeon Ma's contributions to electronic device technology exemplify the spirit of innovation. His patent reflects a commitment to enhancing user interaction through advanced technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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