Seongnam, South Korea

Ji Woon Won

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: G2touch Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ji Woon Won. Retrieved from https://idiyas.com/inventor/ji-woon-won

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ji Woon Won - Innovator in Touch Panel Technology

Introduction

Ji Woon Won is a notable inventor based in Seongnam, South Korea. He has made significant contributions to the field of touch panel technology. His innovative approach has led to the development of a unique touch panel design that enhances user experience.

Latest Patents

Ji Woon Won holds a patent for a "Touch panel with iso-resistance compensation pattern." This invention relates to a touch panel that incorporates a resistive compensation pattern. The touch panel features a matrix of multiple rows and columns of touch electrodes, connected to sensor signal lines. A touch drive integrated circuit (IC) analyzes touch signals to determine if a touch has occurred. Notably, a dummy signal line is included in the sensor signal lines to ensure resistance matching within an allowable tolerance.

Career Highlights

Ji Woon Won is associated with G2touch Co., Ltd., where he continues to innovate in touch technology. His work has been instrumental in advancing the capabilities of touch panels in various applications.

Collaborations

Ji Woon Won collaborates with Joo Bin Park, contributing to the development of cutting-edge technologies in their field.

Conclusion

Ji Woon Won's contributions to touch panel technology exemplify the spirit of innovation. His patent reflects a commitment to enhancing user interaction through advanced design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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