Yongin, South Korea

Ji-Won Yoo

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ji-Won Yoo. Retrieved from https://idiyas.com/inventor/ji-won-yoo-q5olkyow

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 12.0

ph-index = 1

Forward Citations = 45(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ji-Won Yoo

Introduction

Ji-Won Yoo is a notable inventor based in Yongin-si, South Korea. He is recognized for his contributions to the field of technology, particularly in the development of user interfaces. His work has significantly impacted the way users interact with display screens.

Latest Patents

Ji-Won Yoo holds a patent for a "Display screen or a portion thereof with a graphical user interface." This innovation showcases his ability to enhance user experience through improved graphical interfaces.

Career Highlights

Ji-Won Yoo is currently employed at Samsung Electronics Co., Ltd., a leading company in the electronics industry. His role at Samsung has allowed him to work on cutting-edge technologies and contribute to the company's reputation for innovation.

Collaborations

Throughout his career, Ji-Won Yoo has collaborated with talented individuals such as Sung-Han Kim and Eun-Young Kim. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Ji-Won Yoo's contributions to the field of technology, particularly through his patent and work at Samsung Electronics, highlight his role as an influential inventor. His innovations continue to shape the future of user interfaces and display technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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