Hwaseong, South Korea

Ji Won Cha

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Semes Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ji Won Cha. Retrieved from https://idiyas.com/inventor/ji-won-cha-nzwdhjy4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ji Won Cha: Inventor in Substrate Treatment Technology.

Introduction

Ji Won Cha is an inventor based in Hwaseong, South Korea. His patent work concerns substrate treatment equipment and methods, including systems for coordinating substrate measurements with transfer-robot positioning.

Latest Patents

Cha is associated with one patent, 1 patent: “Substrate Treating Apparatus and Substrate Treating Method.” The invention describes an analysis part that uses boundary information to calculate the center coordinates of a substrate and its support unit. It assigns those coordinates to the measurement unit and transfer robot, then converts coordinate systems to teach the robot how to position and transfer the substrate.

Career Highlights

Cha’s listed patent is associated with Semes Co., Ltd., a company working in semiconductor manufacturing equipment. The invention addresses coordinate alignment between measurement equipment, substrate supports, and transfer robots.

Collaborations

Chung Woo Lee and Se Won Kim are identified as Cha’s coworkers.

Conclusion

Ji Won Cha’s patent focuses on improving substrate handling by aligning measurement and robot coordinate systems, reflecting his contribution to semiconductor equipment technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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