Seoul, South Korea

Ji Seon Bak

This inventor holds 1 USPTO granted patent. Top assignee: National Institute of Meteorological Sciences. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ji Seon Bak. Retrieved from https://idiyas.com/inventor/ji-seon-bak

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Ji Seon Bak: Innovator in Precipitation Measurement Technology.

Introduction

Ji Seon Bak is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of meteorology through his innovative inventions. His work focuses on developing technologies that enhance the measurement of precipitation.

Latest Patents

Ji Seon Bak holds a patent for a "Self-powered apparatus for measuring precipitation and method for controlling the same." This invention features a self-powered apparatus designed to measure precipitation effectively. The apparatus includes a housing, a display unit with lights to indicate the amount of precipitation, a water collecting vessel, a cup module for accommodating collected precipitation, an electric signaling unit, a guiding module, a self-powered generator, and a drainage opening.

Career Highlights

Ji Seon Bak is affiliated with the National Institute of Meteorological Sciences, where he applies his expertise in meteorological technologies. His work has been instrumental in advancing the methods used for precipitation measurement.

Collaborations

Ji Seon Bak collaborates with talented individuals such as Geon Tae Kim and Seon Jeong Kim, who contribute to his research and development efforts.

Conclusion

Ji Seon Bak's innovative approach to precipitation measurement exemplifies the importance of technological advancements in meteorology. His contributions are paving the way for more accurate weather monitoring systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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