Hwaseong, South Korea

Ji-Han Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Hyundai Motor Company, Incheon University Industry Academic Cooperation Foundation, Kia Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ji-Han Lee. Retrieved from https://idiyas.com/inventor/ji-han-lee-0ng2pqvf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ji-Han Lee: Patent on Power Factor Correction Switching

Introduction

Ji-Han Lee is an inventor associated with Hwaseong, South Korea. His patent work includes a method for controlling a power factor correction circuit to reduce leakage current.

Latest Patents

Lee is credited with 1 patent: “Power factor correction circuit switching method for reducing leakage current.” The method describes a staged process for increasing an output capacitor’s voltage. A controller first performs an initial charging operation, then increases the voltage further according to whether it reaches a preset reference level. Once a second reference level is reached, the controller switches the circuit’s first and second poles at different duty ratios.

Career Highlights

Lee is associated with Hyundai Motor Company and Kia Corporation. The available information does not specify his roles or dates of employment at either company.

Collaborations

Lee’s listed coworkers include Ye-Rin Lee and Dae-woo Lee. The available information does not detail their specific contributions to his patent.

Conclusion

Ji-Han Lee’s patent describes a staged power factor correction switching method intended to reduce leakage current, reflecting his documented work in electrical and automotive-related innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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