Jhih-Wei Fang

Title: Jhih-Wei Fang: Innovator in Probe Station Technology

Introduction

Jhih-Wei Fang is a notable inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of probe station technology, holding a total of 2 patents. His work focuses on enhancing the precision and functionality of probe stations used in electronic testing.

Latest Patents

Fang's latest patents include a "Probe station capable of maintaining position of probe tip upon temperature change." This innovative probe station design features a base, an adaptor, a probe holder, and a probe. The adaptor is structured to ensure that the thermal coefficients of the components work in harmony, maintaining the position of the probe tip despite temperature fluctuations. Another significant patent is the "Wafer probe station," which includes a first shielding box, a chuck, a stage, and an electronic testing instrument. This design effectively shields against electromagnetic interference, ensuring accurate testing of devices.

Career Highlights

Jhih-Wei Fang is currently employed at Mpi Corporation, where he continues to develop cutting-edge technologies in the field of electronic testing. His expertise in probe station design has positioned him as a key player in the industry.

Collaborations

Fang collaborates with talented coworkers, including Yu-Hsun Hsu and Sebastian Giessmann, to drive innovation and improve the capabilities of their products.

Conclusion

Jhih-Wei Fang's contributions to probe station technology demonstrate his commitment to advancing electronic testing methods. His patents reflect a deep understanding of the challenges in the field and a dedication to finding effective solutions.