Changhua, Taiwan

Jhen-Jia Hu

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Industrial Technology Research Institute. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jhen-Jia Hu. Retrieved from https://idiyas.com/inventor/jhen-jia-hu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Jhen-Jia Hu and Human-Machine Safety Monitoring.

Introduction

Jhen-Jia Hu is an inventor associated with Changhua, Taiwan. Her work includes a patent for a safety monitoring system designed to support safer interaction between people and machines.

Latest Patents

Hu is credited with 1 patent: “Safety Monitoring System for Human-Machine Symbiosis and Method Using the Same.” The invention describes a system that captures images of a work area and identifies changes in human skeleton positions over time. It uses this information to generate spatial gesture images and assess gesture distribution against a safety distance. A process monitoring unit then determines whether the distribution meets a defined safety criterion.

Career Highlights

Hu is associated with the Industrial Technology Research Institute. Her patented work focuses on monitoring human-robot interaction and evaluating safety conditions in shared workspaces.

Collaborations

Hu’s listed coworkers include Chung-Ning Huang and Hau-Wei Wang. The patent’s described system brings together spatial image capture, image recognition, interaction-safety monitoring, and process monitoring.

Conclusion

Jhen-Jia Hu’s patent addresses human-machine safety by combining image-based gesture analysis with safety-distance and process monitoring.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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