Company Filing History:
Years Active: 2022
Title: Innovations of Jesus I Mejia-Silva
Introduction
Jesus I Mejia-Silva is an accomplished inventor based in Frisco, TX (US). He has made significant contributions to the field of radiation detection technology. His innovative approach has led to the development of a unique method for integrating monolithic thin film radiation detector systems.
Latest Patents
One of Mejia-Silva's notable patents is titled "Method for the integration of monolithic thin film radiation detector systems." This patent describes a thin film radiation detection device that includes a photosensitive p-n diode, a polysilicon thin film transistor (TFT), a radiation detection layer, and a substrate. The photosensitive p-n diode and the TFT are formed on the substrate. The radiation detection layer is positioned above the substrate and is designed to receive multiple radiations. The photosensitive p-n diode generates a detector signal based on the conversion output from the radiation detection layer. The TFT then amplifies this detector signal, enhancing the device's functionality. Mejia-Silva holds 1 patent in this area.
Career Highlights
Mejia-Silva is affiliated with the University of Texas System, where he continues to advance his research and development efforts. His work has been instrumental in pushing the boundaries of radiation detection technology, making significant strides in the field.
Collaborations
Throughout his career, Mejia-Silva has collaborated with esteemed colleagues such as Manuel A Quevedo-Lopez and Bruce E Gnade. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Jesus I Mejia-Silva is a prominent figure in the field of radiation detection, with a focus on innovative technologies that enhance detection capabilities. His contributions through patents and collaborations reflect his commitment to advancing scientific knowledge and technology.