Company Filing History:
Years Active: 1995-2009
Title: Jerry M Soden: Innovator in Integrated Circuit Testing
Introduction
Jerry M Soden is a notable inventor based in Placitas, NM (US), recognized for his contributions to the field of integrated circuit (IC) testing. With a total of 4 patents to his name, Soden has developed innovative methods and systems that enhance the reliability and efficiency of IC analysis.
Latest Patents
One of Soden's latest patents is titled "System and method for floating-substrate passive voltage contrast." This invention discloses a PVC system and method for analyzing ICs to locate defects and failure mechanisms. The method maintains the device side of a semiconductor die in an electrically-floating condition while a charged particle beam scans over it. This approach allows for the detection of secondary particle emissions, forming images of device features and pinpointing defects. Another significant patent is "Apparatus and method for defect testing of integrated circuits." This invention provides an operating voltage to an IC under test and measures transient voltage components produced in response to switching transients. The amplitude or time delay of the signal can distinguish between defective and defect-free ICs, making it valuable for IC process development and reliability qualification.
Career Highlights
Throughout his career, Jerry M Soden has worked with prominent organizations, including Sandia Corporation and the United States of America as represented by the United States. His work has significantly impacted the field of integrated circuits, particularly in testing and failure analysis.
Collaborations
Soden has collaborated with notable individuals in his field, including Edward I Cole and Ann N Campbell. These collaborations have contributed to the advancement of technologies related to integrated circuit testing.
Conclusion
Jerry M Soden's innovative work in integrated circuit testing has led to significant advancements in the field. His patents reflect a commitment to improving the reliability and efficiency of IC analysis, making him a key figure in the industry.
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