Clarence, NY, United States of America

Jerry G Chutkow

This inventor holds 1 USPTO granted patent. Top assignee: Apollo Research Corp.. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jerry G Chutkow. Retrieved from https://idiyas.com/inventor/jerry-g-chutkow

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jerry G. Chutkow

Introduction

Jerry G. Chutkow is an accomplished inventor based in Clarence, NY (US). He is known for his innovative contributions to technology, particularly in the field of measurement devices. With a focus on practical applications, Chutkow has made significant strides in his area of expertise.

Latest Patents

Chutkow holds a patent for a reflex measuring device and method. This invention showcases his ability to create tools that enhance measurement accuracy and efficiency. His patent portfolio includes 1 patent, reflecting his commitment to innovation.

Career Highlights

Throughout his career, Chutkow has worked with Apollo Research Corporation, where he has been able to apply his inventive skills in a collaborative environment. His role at the company has allowed him to contribute to various projects that push the boundaries of technology.

Collaborations

Chutkow has collaborated with notable colleagues, including Patrick Flanagan and Michael Terry Riggs. These partnerships have fostered a creative atmosphere that encourages the development of new ideas and solutions.

Conclusion

Jerry G. Chutkow's work exemplifies the spirit of innovation in the field of measurement technology. His contributions, particularly through his patent, highlight the importance of creativity and collaboration in advancing technological solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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