This inventor holds 4 USPTO granted patents. Top assignee: Southwest Research Institute. Active years: 1989-1996.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1989-1996
Title: Jerome J Dziuk, Jr: Innovator in Surface Measurement Technologies
Introduction
Jerome J Dziuk, Jr. is a notable inventor based in San Antonio, TX (US). He has made significant contributions to the field of surface measurement technologies, holding a total of 4 patents. His work focuses on innovative methods for assessing material degradation and detecting chemical reactants.
Latest Patents
Dziuk's latest patents include a surface resistivity meter designed to determine the surface degradation of highly resistive materials, such as polymers. This apparatus utilizes a special probe that provides an annular resistance on the surface of the material sample. The voltage drop across the sample is measured to determine the input to a meter circuit, allowing for the use of a very low voltage source. Another significant patent involves a method for detecting vapor and liquid reactants, such as ammonia. This paint or coating composition, which includes ethyl cellulose as a binder and bromophenol blue as a dye, serves as a passive detector for low concentrations of vapor or liquid reactants. The composition can regenerate to its original color, enabling repeated detection capabilities.
Career Highlights
Jerome J Dziuk, Jr. is affiliated with the Southwest Research Institute, where he continues to advance his research and development efforts. His innovative work has positioned him as a key figure in the field of material science and surface measurement.
Collaborations
Dziuk has collaborated with notable colleagues, including William A Mallow and Howard S Silvus, Jr. These partnerships have contributed to the advancement of his research and the successful development of his patented technologies.
Conclusion
Jerome J Dziuk, Jr. exemplifies the spirit of innovation through his contributions to surface measurement technologies. His patents reflect a commitment to enhancing the understanding of material degradation and detection methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
