Mequon, WI, United States of America

Jerome G Santowski

This inventor holds 1 USPTO granted patent. Top assignee: Broan Mfg. Co., Inc.. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jerome G Santowski. Retrieved from https://idiyas.com/inventor/jerome-g-santowski

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Jerome G. Santowski: Innovator in Point of Sale Solutions

Introduction

Jerome G. Santowski is a notable inventor based in Mequon, Wisconsin. He has made significant contributions to the field of merchandising with his innovative designs. His work primarily focuses on enhancing the functionality and efficiency of point of sale systems.

Latest Patents

Jerome holds a patent for a "Point of Sale Merchandise Stand Having Rotating Display." This invention aims to improve the customer experience by providing a more accessible and visually appealing way to showcase products.

Career Highlights

Jerome is currently employed at Broan Manufacturing Company, Inc., where he continues to develop innovative solutions in merchandising. His dedication to improving point of sale systems has made a positive impact on the retail industry.

Collaborations

Throughout his career, Jerome has collaborated with talented individuals such as Evarist R. Henke and William A. Kaepernick. These partnerships have fostered creativity and innovation in their projects.

Conclusion

Jerome G. Santowski is a distinguished inventor whose work in point of sale solutions has greatly influenced the retail sector. His innovative spirit and collaborative efforts continue to drive advancements in merchandising technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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