Jeri J Crowley

Title: Jeri J Crowley: Innovator in Integrated Circuit Testing

Introduction

Jeri J Crowley is a notable inventor based in Garland, TX (US). She has made significant contributions to the field of integrated circuit testing. With a focus on enhancing the reliability of electronic components, her work has implications for various industries reliant on advanced technology.

Latest Patents

Jeri J Crowley holds a patent for a "Value-strength based test pattern generator and process." This innovative automatic test pattern generator assigns value-strength numbers to selected nodes that represent the electrical characteristic strength of integrated circuits, including field effect transistors. The logic state values at these nodes are crucial for establishing patterns for test signals. These test signals are later utilized in chip testers to determine the quality of integrated circuit chips. Additionally, the value-strength numbers are employed in dynamic testing of the integrated circuit nodes, using clock signals to establish transitions at test paths.

Career Highlights

Jeri J Crowley is associated with Texas Instruments Corporation, a leading company in the semiconductor industry. Her work at Texas Instruments has allowed her to contribute to advancements in integrated circuit technology. With her innovative approach, she has played a vital role in improving testing methodologies for electronic components.

Collaborations

Throughout her career, Jeri has collaborated with esteemed colleagues such as Theo J Powell and John I Hickman. These collaborations have fostered an environment of innovation and have led to significant advancements in the field of integrated circuit testing.

Conclusion

Jeri J Crowley is a pioneering inventor whose contributions to integrated circuit testing have made a lasting impact on the industry. Her innovative patent and work at Texas Instruments Corporation highlight her dedication to advancing technology.