Company Filing History:
Years Active: 2009
Title: Jeremy Jenum - Innovator in Semiconductor Inspection Technology
Introduction
Jeremy Jenum is a notable inventor based in Plymouth, MN (US). He has made significant contributions to the semiconductor and microelectronics industry through his innovative work. His expertise lies in developing advanced technologies that enhance the efficiency and accuracy of defect inspection systems.
Latest Patents
Jeremy holds a patent for an "Automated wafer defect inspection system using backside illumination." This invention is designed to improve the defect inspection process for wafers and other semiconductor or electronic substrates. The system is capable of inspecting materials that are transparent, translucent, opaque, or otherwise allow some light to pass through, making it versatile for various applications in the industry.
Career Highlights
Jeremy Jenum is currently employed at Rudolph Technologies, Inc., where he continues to push the boundaries of technology in semiconductor inspection. His work has been instrumental in developing systems that ensure the quality and reliability of electronic components.
Collaborations
Throughout his career, Jeremy has collaborated with talented professionals, including Mark Harless and Willard Charles Raymond. These partnerships have fostered innovation and have contributed to the advancement of inspection technologies in the semiconductor field.
Conclusion
Jeremy Jenum's contributions to the semiconductor industry through his patented technologies highlight his role as an influential inventor. His work continues to impact the efficiency of defect inspection systems, ensuring high standards in electronic manufacturing.