Jeremiah R Lowney

Title: Jeremiah R. Lowney: Innovator in Integrated Circuit Technology

Introduction

Jeremiah R. Lowney is a notable inventor based in Leonardtown, MD (US). He has made significant contributions to the field of integrated circuit technology. His innovative approach has led to the development of a unique method for extracting overlay information from integrated circuit wafers.

Latest Patents

Lowney holds a patent for a method titled "Target configuration and method for extraction of overlay vectors from." This patent describes a technique for extracting overlay information from a target of an integrated circuit wafer. The method involves scanning a target with an electron beam of sufficient energy to penetrate an overlying opaque planarized film. The architecture of the target includes a resist feature on the planarized film and an embedded electron backscattering target feature beneath the film. The electrons backscattered from the conductive first-level target feature are detected, and a signal profile is generated to extract overlay information.

Career Highlights

Jeremiah R. Lowney is associated with the Government of the United States of America, as represented by the Secretary of Commerce. His work has been instrumental in advancing the understanding and capabilities of integrated circuit technology.

Collaborations

Lowney has collaborated with notable colleagues, including Michael W. Cresswell and Santos Mayo. Their combined expertise has contributed to the success of various projects in the field.

Conclusion

Jeremiah R. Lowney's innovative contributions to integrated circuit technology and his patent for overlay extraction methods highlight his role as a significant inventor in this domain. His work continues to influence advancements in the industry.