Tokyo, Japan

Jeremiah Anderson

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Rakuten Group, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeremiah Anderson. Retrieved from https://idiyas.com/inventor/jeremiah-anderson-smstth0i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Jeremiah Anderson

Introduction

Jeremiah Anderson is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of information processing through his innovative patent. His work focuses on utilizing machine learning to enhance the analysis of satellite imagery.

Latest Patents

Jeremiah holds a patent for an "Information processing apparatus, information processing method, and non-transitory computer readable medium." This invention includes an acquisition unit that acquires satellite images, a first generation unit that predicts and generates a first image representing population distribution, and a second generation unit that predicts land type probabilities, all through machine learning techniques.

Career Highlights

Jeremiah is currently employed at Rakuten Group, Inc., where he applies his expertise in information processing. His innovative approach has positioned him as a valuable asset in the tech industry.

Collaborations

Some of his coworkers include Vinayaraj Poliyapram and Mayank Bansal, who contribute to the collaborative environment at Rakuten Group, Inc.

Conclusion

Jeremiah Anderson's work exemplifies the intersection of technology and innovation, particularly in the realm of information processing. His contributions are paving the way for advancements in satellite image analysis and machine learning applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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