Hsinchu, Taiwan

Jer-Wei Chang

This inventor holds 1 USPTO granted patent. Top assignee: J-Metrics Technology Co., Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jer-Wei Chang. Retrieved from https://idiyas.com/inventor/jer-wei-chang-diif2t01

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Jer-Wei Chang: Innovator in Electronic Apparatus Technology

Introduction

Jer-Wei Chang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of electronic apparatus technology, particularly in the development of innovative biometric sensors. His work focuses on enhancing user interaction through advanced human-machine interfaces.

Latest Patents

Jer-Wei Chang holds a patent for an "Electronic apparatus with segmented guiding function and small-width biometrics sensor, and guiding method thereof." This invention comprises a body, a human-machine interface device, a small-width biometrics sensor, and a processing module. The design allows the biometric sensor to capture partial physical patterns of a user's finger, enhancing the accuracy and efficiency of biometric recognition.

Career Highlights

Chang is associated with J-Metrics Technology Co., Ltd., where he applies his expertise in developing cutting-edge electronic devices. His innovative approach has positioned him as a key player in the advancement of biometric technology.

Conclusion

Jer-Wei Chang's contributions to electronic apparatus technology and biometric sensors demonstrate his commitment to innovation. His work continues to influence the field and improve user experiences with electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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