Gyeonggi-do, South Korea

Jeongsuk Choi

This inventor holds 1 USPTO granted patent. Top assignee: Hctm Co., Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeongsuk Choi. Retrieved from https://idiyas.com/inventor/jeongsuk-choi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Jeongsuk Choi: Innovator in Particle Measurement Technology

Introduction

Jeongsuk Choi is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of particle measurement technology. His innovative approach has led to the development of a unique particle measuring system that enhances measurement accuracy and convenience.

Latest Patents

Jeongsuk Choi holds 1 patent for his invention titled "Particle Measuring System." This system includes two drying units, where one unit is designed to dry fine particles, while the other regenerates a dehumidifying agent. The regeneration process allows the dehumidifying agent to be used semi-permanently, eliminating the need for frequent replacements. This innovation improves the continuity and accuracy of measurement results, making it a valuable advancement in the industry.

Career Highlights

Choi is currently associated with Hctm Co., Ltd., where he continues to work on innovative solutions in particle measurement. His expertise and dedication to research have positioned him as a key figure in his field.

Collaborations

Jeongsuk Choi collaborates with talented individuals such as Cheolhong Kim and Youngmin Seo. Their combined efforts contribute to the advancement of technology in particle measurement systems.

Conclusion

Jeongsuk Choi's work in developing a particle measuring system showcases his innovative spirit and commitment to improving measurement technologies. His contributions are paving the way for more efficient and accurate particle measurement solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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