Pohang, South Korea

Jeong Tack Min

This inventor holds 1 USPTO granted patent. Top assignee: Korea Institute of Robot & Convergence. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeong Tack Min. Retrieved from https://idiyas.com/inventor/jeong-tack-min

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Jeong Tack Min: Innovator in Research Data Collection

Introduction

Jeong Tack Min is a prominent inventor based in Pohang-si, South Korea. He has made significant contributions to the field of research data collection through his innovative patent. His work is instrumental in enhancing the efficiency of data gathering processes in various research environments.

Latest Patents

Jeong Tack Min holds a patent for an "Apparatus and method for automatically collecting research data." This invention provides a collecting apparatus that includes a collector for gathering test data generated in a specific test space, a data server for storing the test data, and a handler for the administrator. This patent showcases his commitment to advancing technology in research methodologies.

Career Highlights

Jeong Tack Min is affiliated with the Korea Institute of Robot & Convergence, where he applies his expertise in robotics and data collection. His role at this esteemed institution allows him to work on cutting-edge projects that push the boundaries of technology and innovation.

Collaborations

He collaborates with talented colleagues, including Seung Sub Oh and Soo Beom Jeon. Their combined efforts contribute to the development of innovative solutions in their field.

Conclusion

Jeong Tack Min's contributions to research data collection through his patent reflect his dedication to innovation and technology. His work continues to influence the way data is gathered and utilized in research settings.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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