Kyungki-do, South Korea

Jeong Soo Lee

This inventor holds 1 USPTO granted patent. Top assignee: Lg Semicon Co., Ltd.. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeong Soo Lee. Retrieved from https://idiyas.com/inventor/jeong-soo-lee-5yir4nfa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Jeong Soo Lee: Innovator in X-ray Technology

Introduction

Jeong Soo Lee is a prominent inventor based in Kyungki-do, South Korea. He has made significant contributions to the field of X-ray technology, particularly through his innovative patent related to X-ray absorbers.

Latest Patents

Jeong Soo Lee holds a patent for an "X-ray absorber in an X-ray mask and method for manufacturing the same." This invention includes a first layer of crystalline phase formed on a predetermined portion of the surface of a membrane and a second layer of amorphous phase formed on the first layer. His work in this area has the potential to enhance the efficiency and effectiveness of X-ray imaging.

Career Highlights

Jeong Soo Lee is currently employed at LG Semicon Co., Ltd., where he continues to develop cutting-edge technologies in the semiconductor industry. His expertise in X-ray technology has positioned him as a valuable asset to his company.

Collaborations

Jeong Soo Lee has collaborated with notable colleagues, including Don-Hee Lee and Chil-Keun Park. These partnerships have fostered a creative environment that encourages innovation and the advancement of technology.

Conclusion

Jeong Soo Lee's contributions to X-ray technology through his patent and work at LG Semicon Co., Ltd. highlight his role as an influential inventor in the field. His innovative approach continues to pave the way for advancements in imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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