Suwon, South Korea

Jeong Min Lee

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeong Min Lee. Retrieved from https://idiyas.com/inventor/jeong-min-lee-asf3d7od

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Jeong Min Lee and Radiographic Imaging Innovation.

Introduction

Jeong Min Lee is an inventor based in Suwon, South Korea, and is associated with Samsung Electronics Co., Ltd. His work includes an invention focused on radiographic imaging and reliable image processing.

Latest Patents

Lee is credited with 1 patent: “Radiographic Imaging Apparatus and a Method of Controlling the Same.” The patent describes an apparatus that captures image data of a subject and uses separate real-time and non-real-time processors to process it. If the real-time processor fails, the non-real-time processor can take over its authority and perform real-time image processing.

Career Highlights

Lee’s disclosed patent addresses continuity in radiographic image processing by providing a backup path for real-time operations. This approach is designed to help maintain processing when the primary real-time processor encounters a failure.

Collaborations

The provided information identifies Qin Liu and Woo Sup Han as Lee’s coworkers. The patent’s focus on coordinated processing also reflects the importance of collaboration between imaging and computing components.

Conclusion

Jeong Min Lee’s radiographic imaging patent presents a processor-failover approach intended to support dependable real-time image processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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