Jeong Ho Yeo

Title: **Innovative Contributions of Jeong Ho Yeo in Surface Characterization**

Introduction

Jeong Ho Yeo, an inventor based in Kyounggi-do, South Korea, has made noteworthy strides in the field of surface characterization. With a patent to his name, he has developed a method aimed at enhancing the precision with which surface characteristics of sample objects can be evaluated.

Latest Patents

His patent, titled "High throughput across-wafer-variation mapping," introduces a technique for characterizing a surface by dividing it into pixels defined by parameter variations. This innovative method involves irradiating the pixels through multiple scans with radiation of different polarizations. The returning radiation from these pixels is detected, allowing for the construction of block signatures from the groups of pixels within designated blocks. By analyzing block signature variations, this method ultimately facilitates the selection of appropriate types of polarization for future examination of test objects.

Career Highlights

Jeong Ho Yeo currently works with Applied Materials Israel Limited, a prominent player in the semiconductor and display industries. His contributions to surface characterization techniques are instrumental in advancing the quality and efficiency of material testing processes.

Collaborations

Throughout his career, he has collaborated with skilled professionals, including Efrat Rosenman and Erez Ravid. These partnerships have been critical in refining his methods and expanding the applications of his patented technologies.

Conclusion

With his innovative approach to surface characterization, Jeong Ho Yeo is making a significant impact on the field. His work not only enhances the understanding of material properties but also supports various technological advancements in the semiconductor industry.