Namyangju, South Korea

Jeong-geun Cho

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeong-geun Cho. Retrieved from https://idiyas.com/inventor/jeong-geun-cho

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Jeong-geun Cho: Innovator in X-ray Detection Technology

Introduction

Jeong-geun Cho is a notable inventor based in Namyangju, South Korea. He has made significant contributions to the field of X-ray detection technology. His innovative work has led to the development of a patented apparatus that enhances the efficiency of X-ray tomography scanning.

Latest Patents

Cho holds a patent for an X-ray detecting apparatus and method of operating the same. This invention provides an X-ray detecting apparatus capable of controlling the electric power supplied to an X-ray detector module during X-ray tomography scanning. The apparatus includes a heat dissipation structure within the X-ray detector module, which is crucial for maintaining optimal performance during operation.

Career Highlights

Jeong-geun Cho is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His role at Samsung has allowed him to work on cutting-edge technologies and contribute to advancements in medical imaging.

Collaborations

Some of his coworkers include Sung-kyu Park and Dae-yeong Jang, who have collaborated with him on various projects within the company.

Conclusion

Jeong-geun Cho's contributions to X-ray detection technology exemplify the innovative spirit of modern inventors. His patented work not only enhances medical imaging but also showcases the importance of collaboration in technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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