Jeonju, South Korea

Jeong-chay Jeon

This inventor holds 1 USPTO granted patent. Top assignee: Korea Electrical Safety Corporation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeong-chay Jeon. Retrieved from https://idiyas.com/inventor/jeong-chay-jeon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Jeong-chay Jeon: Innovator in Cable Fault Diagnosis

Introduction

Jeong-chay Jeon is a notable inventor based in Jeonju, South Korea. He has made significant contributions to the field of electrical safety through his innovative patent. His work focuses on improving the accuracy and reliability of cable fault diagnosis systems.

Latest Patents

Jeon holds a patent for a "Cable fault diagnosis method and system." This invention addresses the challenges faced when an application signal and a reflected signal overlap due to the proximity of a fault location. The system derives a correction location based on a prescribed correlation function, allowing for accurate detection of fault types and locations, even when the reflected signal is weak.

Career Highlights

Jeong-chay Jeon is associated with the Korea Electrical Safety Corporation, where he applies his expertise in electrical safety and diagnostics. His innovative approach has led to advancements in the reliability of cable inspections.

Collaborations

Jeon has collaborated with notable colleagues, including Jae-jin Kim and Myeong-il Choi. Their teamwork has contributed to the development of effective solutions in the field of electrical safety.

Conclusion

Jeong-chay Jeon is a distinguished inventor whose work in cable fault diagnosis has enhanced the safety and reliability of electrical systems. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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