Jens Kessler

Title: Jens Kessler: Innovator in X-Ray Fluorescence Analysis

Introduction

Jens Kessler is a notable inventor based in Stuttgart, Germany. He has made significant contributions to the field of x-ray fluorescence analysis, showcasing his expertise through innovative methods and devices. His work is particularly relevant in various scientific and industrial applications.

Latest Patents

Jens Kessler holds a patent for a "Method and device for performing an x-ray fluorescence analysis." This invention involves directing primary radiation at a specimen using an x-radiation source. The secondary radiation emitted by the specimen is then detected and evaluated. A unique aspect of this method is the incorporation of a filter that acts as a band-pass filter, allowing for the selective coupling out of interfering wavelengths through Bragg reflection. This innovative approach enhances the accuracy and efficiency of x-ray fluorescence analysis.

Career Highlights

Kessler is associated with Helmut Fischer GmbH Institut Für Elektronik Und Messtechnik, where he applies his knowledge and skills in electronics and measurement technology. His work at this esteemed institution has allowed him to further develop his inventions and contribute to advancements in the field.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Jens Kessler's contributions to x-ray fluorescence analysis exemplify the impact of innovative thinking in scientific research. His patent reflects a commitment to enhancing measurement techniques, which can lead to significant advancements in various industries.