The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2016
Filed:
Oct. 22, 2013
Helmut Fischer Gmbh Institut Fur Elektronik Und Messtechnik, Sindelfingen, DE;
Jens Kessler, Stuttgart, DE;
Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Sindelfingen, DE;
Abstract
The invention relates to a method for performing an x-ray fluorescence analysis, in which method a primary radiation () is directed at a specimen () by an x-radiation source () and in which method a secondary radiation () emitted by the specimen () is detected by a detector () and evaluated by means of an evaluating unit (), wherein at least one filter () having at least one filter layer () forming a filter plane is brought into the beam path of the secondary radiation () and acts as a band-pass filter in dependence on an angle α of the filter layer () to the secondary radiation () and an interfering wavelength of the secondary radiation () is coupled out by Bragg reflection, the angle α of the filter layer () of the filter () is set by means of a setting apparatus () to reflect at least one interfering wavelength of the secondary radiation () by Bragg reflection, and the coupled-out wavelength of the secondary radiation () is detected by a second detector () and the signals determined therefrom are forwarded to the evaluating unit ().