Dresden, Germany

Jens Haenisch

This inventor holds 1 USPTO granted patent. Top assignee: Los Alamos National Security, LLC. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jens Haenisch. Retrieved from https://idiyas.com/inventor/jens-haenisch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Jens Haenisch and Superconducting-Conductor Measurement

Introduction

Jens Haenisch is an inventor associated with Dresden, Germany. His patent work concerns measuring the critical-current properties of coated superconductors, including the distribution of current across a superconducting tape.

Latest Patents

The supplied information lists one patent for Haenisch: “Apparatus and Method for Measuring Critical Current Properties of a Coated Conductor.” The invention describes a nondestructive, high-resolution method for measuring the transverse critical-current distribution and critical-current density in YBCO coated conductors.

The method moves a narrow region of low or zero magnetic field across the conductor while the surrounding area remains in a higher magnetic field. Because an applied magnetic field strongly depresses the critical current, this arrangement reveals variations in critical-current density across the sample. A Fourier-series inversion process is then used to determine the transverse distribution.

Career Highlights

Haenisch’s listed patent is connected with Los Alamos National Security, LLC. It highlights an approach to characterizing coated conductors that can help researchers assess their superconducting properties without damaging the sample.

Collaborations

Fred M. Mueller is identified as Haenisch’s coworker. The supplied information does not specify further details about their collaboration.

Conclusion

Jens Haenisch’s listed invention applies magnetic-field control and mathematical analysis to measure critical-current uniformity in YBCO coated conductors, contributing a nondestructive characterization method to superconducting-material research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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