Hoboken, NJ, United States of America

Jennifer N Sekar

This inventor holds 1 USPTO granted patent. Top assignee: Side, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jennifer N Sekar. Retrieved from https://idiyas.com/inventor/jennifer-n-sekar

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jennifer N. Sekar: Patent Inventor at Side, Inc.

Introduction

Jennifer N. Sekar is an inventor associated with Side, Inc. in Hoboken, New Jersey. Her patent work includes a method for extracting, verifying, and populating information from documents.

Latest Patents

Sekar is named on 1 patent, titled “Data Extraction, Verification, and Field Population.” The invention describes receiving a document linked to a checklist item and identifying a template for that document. Using the template, the system locates an area containing a key-value pair and applies optical character recognition (OCR) to extract the value. A user can review and correct the extracted value. The system then uses a second OCR process to analyze the document’s full text, determine where the corrected value appears, and update the first OCR process so it can extract the value from that location.

Career Highlights

The patent reflects work on document-processing technology that combines template-based extraction, user verification, and OCR improvements. These methods are designed to help systems capture and populate information more accurately.

Collaborations

Sekar’s listed coworkers include Amy K. Malanga and David I. Drake. The patent is associated with Side, Inc.

Conclusion

Jennifer N. Sekar’s patent focuses on improving document data extraction through user corrections and adaptive OCR, highlighting her contribution to information-processing innovation at Side, Inc.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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