Jennifer Lynn McKeown

Title: Innovations by Jennifer Lynn McKeown

Introduction

Jennifer Lynn McKeown is a notable inventor based in Travis, Texas. She has made significant contributions to the field of embedded memory testing. Her innovative work has led to the development of a patented technology that enhances the efficiency of memory testing processes.

Latest Patents

Jennifer holds a patent for "Multiple BIST controllers for testing multiple embedded memory arrays." This invention involves multiple memory arrays in embedded applications, each tightly coupled to its own Built-In Self-Test (BIST) controller. The BISTed memory cells support structural and retention testing. Testing on these memories is initiated by common INVOKE, RETENTION, and RELEASE signals. The invention also combines DONE and HOLD signals from the multiple BISTed memories to generate global signals for efficient testing.

Career Highlights

Jennifer is currently employed at Motorola Corporation, where she continues to innovate in the field of embedded systems. Her work has been instrumental in advancing memory testing technologies, making them more reliable and efficient.

Collaborations

Jennifer has collaborated with notable colleagues, including Alfred Larry Crouch and Clark Gilson Shepard. These collaborations have contributed to the success of her projects and the advancement of technology in her field.

Conclusion

Jennifer Lynn McKeown's contributions to embedded memory testing through her innovative patent demonstrate her expertise and commitment to advancing technology. Her work at Motorola Corporation continues to influence the industry positively.