Boylston, MA, United States of America

Jennifer A Stander


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 35(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Innovations by Jennifer A. Stander

Introduction

Jennifer A. Stander is an accomplished inventor based in Boylston, MA (US). She has made significant contributions to the field of conductive materials through her innovative inventions. Her work focuses on developing advanced measurement systems that enhance the detection of flaws in conductive articles.

Latest Patents

Jennifer A. Stander holds a patent for a "Multi-probe impedance measurement system and method for detection of flaws in conductive articles." This innovative multi-dimensional, low frequency, impedance measurement probe array is designed to detect flaws in conductive materials. The system involves contacting a conductive article with a multi-probe array of current and voltage probes. It injects current sequentially through multiple current probe pairs and measures absolute or relative voltages across the surface of the article. This method allows for the construction of a voltage profile, enabling the detection of flaws as small as 20 micrometers. The innovative probe array can be adapted for various sample configurations and surfaces, significantly improving flaw detection capabilities.

Career Highlights

Jennifer has dedicated her career to advancing technology in the field of conductive materials. Her work at Worcester Polytechnic Institute has allowed her to collaborate with other experts in the field and contribute to groundbreaking research.

Collaborations

Throughout her career, Jennifer has worked alongside notable colleagues such as Reinhold Ludwig and John A. McNeill. Their collaborative efforts have further enhanced the impact of her inventions in the industry.

Conclusion

Jennifer A. Stander's innovative contributions to the field of flaw detection in conductive articles demonstrate her expertise and commitment to advancing technology. Her patented multi-probe impedance measurement system represents a significant leap forward in the ability to identify and address flaws in conductive materials.

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