Jengwei Pan

Title: Jengwei Pan: Innovator in Microprocessor Testing

Introduction

Jengwei Pan is a notable inventor based in San Jose, CA. He has made significant contributions to the field of microprocessor testing, particularly through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of testing structures within microprocessors.

Latest Patents

Jengwei Pan holds a patent for a "RAM-like test structure superimposed over rows of macrocells." This invention introduces a test structure to microprocessors that utilizes a RAM-like array of scan-clock word lines. These lines select a row of macrocells for reading or writing operations. The design incorporates scan-data bit lines that run perpendicular to the scan-clock word lines, allowing for efficient data handling. Each macrocell is equipped with true and complement signal nodes connected to scan-data bit lines via n-channel pass transistors. This innovative approach minimizes the area, cost, and delay associated with testing macrocells, making it a valuable advancement in microprocessor technology.

Career Highlights

Jengwei Pan is currently employed at S3 Incorporated, Inc., where he continues to develop and refine his inventions. His work has garnered attention for its practical applications in the tech industry, particularly in improving microprocessor testing methodologies.

Collaborations

Throughout his career, Jengwei has collaborated with notable colleagues, including Hank Lim and Earl T Cohen. These partnerships have contributed to the advancement of technology in their respective fields.

Conclusion

Jengwei Pan's contributions to microprocessor testing through his innovative patent demonstrate his expertise and commitment to advancing technology. His work not only enhances the efficiency of microprocessors but also sets a precedent for future innovations in the field.