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Years Active: 2006
Title: The Innovative Contributions of Jen-Chieh Yeh
Introduction
Jen-Chieh Yeh is a notable inventor based in Tai-Chung, Taiwan. He has made significant contributions to the field of flash memory technology. His innovative approach has led to the development of a unique testing method that enhances the reliability of flash memory devices.
Latest Patents
One of Jen-Chieh Yeh's key patents is the "Diagonal Testing Method for Flash Memories." This invention presents a novel approach to testing flash memories by treating them as several squares. The method executes tests in a systematic direction from top to bottom and from left to right. Each square is equipped with two diagonals: one at -45 degrees from the upper left to the lower right, and another at +45 degrees from the lower left to the upper right. The invention allows for programming cells in either diagonal and reading the cells in the opposite diagonal, or vice versa. This method effectively detects disturb faults in flash memories and normal memory fault models.
Career Highlights
Throughout his career, Jen-Chieh Yeh has worked with reputable organizations, including Spirox Corporation and National Tsinghua University. His experience in these institutions has contributed to his expertise in memory technology and innovation.
Collaborations
Jen-Chieh Yeh has collaborated with esteemed colleagues such as Sau-Kwo Chiu and Kuo-Liang Cheng. Their joint efforts have further advanced the research and development of memory technologies.
Conclusion
Jen-Chieh Yeh's contributions to the field of flash memory testing exemplify his innovative spirit and dedication to technology. His patented methods are a testament to his expertise and impact on the industry.