The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2006
Filed:
Jun. 24, 2003
Sau-kwo Chiu, Miau-Li Hsien, TW;
Jen-chieh Yeh, Tai-Chung, TW;
Kuo-liang Cheng, Shin-Ying, TW;
Chih-tsun Huang, Chia-Yi, TW;
Cheng-wen Wu, Hsinchu, TW;
Sau-Kwo Chiu, Miau-Li Hsien, TW;
Jen-Chieh Yeh, Tai-Chung, TW;
Kuo-Liang Cheng, Shin-Ying, TW;
Chih-Tsun Huang, Chia-Yi, TW;
Cheng-Wen Wu, Hsinchu, TW;
Spirox Corporation/National, Hsinchu, TW;
Tsing Hua University, Hsinchu, TW;
Abstract
The present invention discloses a diagonal testing method for flash memories. The testing method regards the flash memory as several squares, and executes in the direction from top to bottom and from left to right. Each square is provided with a first diagonal in −45 degrees from the upper left to the lower right, and a second diagonal in +45 degrees from the lower left to the upper right. The present invention is to program the cells in the first diagonal or the second diagonal, and then read the cells except the first diagonal or the second diagonal; or, program the cells except the first diagonal or the second diagonal, and then read the cells in the first diagonal or the second diagonal so as to detect the disturb fault in the flash memories and normal memory fault models.